Electrical Noise and Semiconductor Reliability

被引：0
作者：
Băjenescu T.-M.I. [1 ,2 ]
机构：
[1] Honoris Causa of Military Technical Academy of Romania and of Technical University of Republic of Moldova, Chișinău
来源：
EEA - Electrotehnica, Electronica, Automatica | 2023年 / 71卷 / 04期
关键词：
bias; electrical noise; experimental; filament; holes; lifepath; magnetic; magnetic field; noise; noise voltage; recombination; semiconductors; side arms; single crystal; surface; system technical; transit time;
D O I：
10.46904/eea.23.71.4.1108006
中图分类号：
学科分类号：
摘要：
Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices. © Editura ELECTRA 2023. All rights reserved.
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页码：51 / 58
页数：7
相关论文
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