Convolutional neural network for classification of SiO2 scanning electron microscope images

被引：0

作者：

Jayaram, Kavitha ^{[1
]}

Prakash, G. ^{[1
]}

Jayaram, V. ^{[2
]}

机构：

[1] Department of Computer Science and Engineering, Amrita School of Engineering, Amrita Vishwa Vidyapeetham, Bengaluru, India

[2] Solid State and Structural Chemistry Unit, Indian Institute of Science, Bengaluru, India

来源：

International Journal of Business Intelligence and Data Mining | 2022年 / 21卷 / 01期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Convolutional neural networks

引用

页码：118 / 128

共 16 条

[1] CONCERNING THE FORMATION OF IMAGES OF DEEP HOLES IN A SCANNING ELECTRON MICROSCOPE.
Gorodskii, D.D.
Zadorozhnyi, S.S.
Luk'yanov, A.E.
Rau, E.I.
Spivak, G.V.
Moscow University Physics Bulletin (English Translation of Vestnik Moskovskogo Universiteta, Fizika), 1975, 30 (04): : 32 - 36
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[7] Chlorophyll-a Retrieval from Sentinel-2 Images Using Convolutional Neural Network Regression
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Biomedical Signal Processing and Control, 2022, 78
[9] Variations in contrast of scanning electron microscope images for microstructure analysis of Si-based semiconductor materials
Itakura, Masaru
Kuwano, Noriyuki
Sato, Kaoru
Tachibana, Shigeaki
Microscopy, 2010, 59
[10] Land-use classification using convolutional neural network with bagging and reduced categories
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Sugimoto, Satoshi
Takaesu, Ryoma
Ishizuka, Yoichi
Lecture Notes in Engineering and Computer Science, 2019, 2239 : 7 - 11

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