Dynamic test of traveling wave line selecting device based on RTDS small time-step simulation

被引：0
|
作者：
Li Z. [1 ]
Wang W. [1 ]
Zhuang L. [1 ]
Zhou P. [1 ]
Li S. [2 ]
机构：
[1] Xuchang KETOP Testing Technology Co., Ltd., Xuchang
[2] State Grid Xuchang Power Supply Company, Xuchang
来源：
Dianli Xitong Baohu yu Kongzhi/Power System Protection and Control | 2019年 / 47卷 / 23期
关键词：
Dynamic simulation test; Line selection of traveling wave; RTDS; Small time-step simulation;
D O I：
10.19783/j.cnki.pspc.190064
中图分类号：
O441.1 [电学]; TM12 [];
学科分类号：
摘要：
The traveling wave line selection device is one of the important types in the distribution fault line selection devices. The dynamic test is a helpful way to develop and improve the device function. This paper analyzes the basic principle of traveling wave selection and the characteristics of traveling wave transmission in distribution network. It studies the principle of RTDS small time-step simulation and the analog output characteristics of GTAO card, builds the distribution network simulation model by RTDS small time-step. By analyzing various factors affecting the traveling wave selection performance test in the dynamic simulation experiment, it develops the dynamic simulation test scheme for traveling wave selection device and sets up a closed loop test environment. The test result shows that the dynamic test of the traveling wave line selection can be completed by RTDS small time-step simulation. © 2019, Power System Protection and Control Press. All right reserved.
引用
收藏
页码：108 / 114
页数：6
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