Fault diagnosis method based on test set under fault response guidance

In this paper, having deeply studied the fault output characteristics in circuits and the ADD candidate diagnosis solution method, we propose a candidate diagnosis solution method under the guidance of fault response, ALFDD, namely. We also put forward the concept of candidate single fault set, which is based on the principle that a single fault with different actual output response and expected output response under current test excitations is more likely to be a fault diagnosis solution. To overcome the problem that in ADD method to obtain Fsame all single faults of circuit should be compared, we give the method which only considers the faults of the candidate single fault set to obtain Fsame. This method has three merits. Firstly, it does not need to compare all single faults and improves the efficiency of solving problems. Secondly, it eliminates the reluctant candidate solutions concluded in Fsame effectively, so it improves the resolution of candidate diagnostic solutions. In addition, this method improves the accuracy of candidate diagnostic solutions, namely, increasing the number of real diagnostic solutions in the candidate fault sets. The test results show that,, compared with ADD, the proposed ALFDD method increases the resolution, accuracy and solution efficiency for selecting candidate diagnoses. © 2021, Jilin University Press. All right reserved.