Analyzing single event upset on Kintex-7 Field-Programmable-Gate-Array with random fault injection method

被引：3

作者：

Wang Z. ^{[1
]}

Chen W. ^{[1
,2
]}

Yao Z. ^{[2
]}

Zhang F. ^{[2
]}

Luo Y. ^{[2
]}

Tang X. ^{[1
]}

Peng C. ^{[1
]}

Ding L. ^{[2
]}

Guo X. ^{[2
]}

机构：

[1] Department of Nuclear Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing

[2] State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi'an

来源：

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2021年 / 966卷

基金：

中国国家自然科学基金;

关键词：

Fault injection; FPGA; Random injection; Triple module redundancy;

D O I：

10.1016/j.nima.2020.163866

中图分类号：

学科分类号：

摘要：

In this paper, the bitstream of 28 nm field-programmable-gate-array was resolved. The relationship between the frame address and the resource was obtained. The fault injection platform was designed based on the information of the bitstream which obtained by partial reconfiguration. With this fault injection platform, the equivalence of the global fault and random fault injections was verified. Also, the sensitivities of different circuits were tested by random fault injection. The reinforcement effect of the triple module redundancy for sensitive resources in 28 nm FPGA was also be tested. © 2020

引用

共 16 条

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