Coupling Conditioning Effect of DKDP Crystals Under Simultaneous Irradiation by 1064 nm laser and 355 nm Laser

被引:0
作者
Wu J. [1 ,2 ,4 ]
Zhao Y. [2 ,4 ,5 ]
Wang L. [1 ]
Peng X. [2 ,3 ,4 ]
Yang L. [2 ,4 ]
Shan C. [6 ]
Shao J. [2 ,4 ]
机构
[1] School of Materials Science and Engineering, Shanghai University, Shanghai
[2] Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics, Shanghai
[3] Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing
[4] Key Laboratory of Materials for High Power Laser, Chinese Academy of Sciences, Shanghai
[5] State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, Jilin
[6] Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai
来源
Zhongguo Jiguang/Chinese Journal of Lasers | 2019年 / 46卷 / 05期
关键词
Conditioning effect; Crystals; Damage defects; Laser optics; Multi-wavelength laser;
D O I
10.3788/CJL201946.0501003
中图分类号
学科分类号
摘要
To study the characteristics of multi-wavelength laser-induced damages in DKDP crystals used in the inertial confinement fusion (ICF) device, a damage test facility is established, in which the DKDP crystals are under the simultaneous irradiation of 1064 nm and 355 nm lasers. The damage pinpoint morphology, density, size, and damage probability under exposure by a combination of different laser fluences are compared and analyzed. When irradiating a sample with 355-nm laser pulses in R-on-1 tests, 1064-nm laser pulses with different fluences are added. The results show that as the 1064-nm laser fluence increases, the laser damage resistance of the sample increases, the damage pinpoint morphology tends to be similar with that when the sample is irradiated by the 1064 nm laser alone, the damage pinpoint density decreases, and the damage pinpoint size increases. As a whole, the coupling conditioning effect is clearly exhibited. © 2019, Chinese Lasers Press. All right reserved.
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