Microstructure and defect study in thin film heterostructure materials

被引：0
作者：
Wu F. [1 ]
机构：
[1] John A. Paulson School of Engineering and Applied Sciences, Harvard University, Cambridge, 02138, MA
来源：
Nanoscience and Nanotechnology - Asia | 2020年 / 10卷 / 02期
基金：
美国国家科学基金会;
关键词：
Defects; Microstructure; Na-nomaterials synthesis and characterization; Pulsed-laser deposition; Thin-film heterostructures; Transmission electron microscopy;
D O I：
10.2174/2210681208666181008143408
中图分类号：
学科分类号：
摘要：
Deformation twins and phase interface are important planar defects and microstructures that greatly influence the overall performance of a material system. In multi-layer thin-film heterostruc-tures, their effect is more manifest due to the small dimension of thin films and their influence on the growth of multi-layer structures. This article reviews the recent progress in microstructure and defects observed in thin film heterostructures, serving as a guideline for future research in this field. The multilayer thin-film heterostructures studied here were grown by pulsed laser deposition technique. Micro-structures and defects were investigated by Transmission Electron Microscopy. © 2020 Bentham Science Publishers.
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页码：109 / 116
页数：7
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