On automating delayered IC analysis for hardware IP protection

被引：0
|
作者：
Sarkar, Esha [1 ]
Maniatakos, Michail [2 ]
机构：
[1] Electrical and Computer Engineering Tandon School of Engineering, New York University, United States
[2] Center for Cyber Security, New York University Abu Dhabi, United States
来源：
ACM International Conference Proceeding Series | 2019年 / Part F148162卷
关键词：
Automated IC analysis - Automated test pattern generations - Automated tools - Hardware ip protections - Integrated circuits (ICs) - Malicious circuits - Physical inspection - Production cost;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
35
引用
收藏
页码：205 / 210
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