De-embedding algorithm for odd port network parameters

被引：1

作者：

Tsiklauri M. ^{[1
]}

Dikhaminjia N. ^{[2
]}

机构：

[1] I. Vekua Institute of Applied Mathematics, Javakhishvili Tbilisi State University, Tbilisi

[2] Ilia State University, School of Natural Science and Engineering, 3/5 Kakutsa Cholokashvili Avenue, Tbilisi

来源：

IEEE Electromagnetic Compatibility Magazine | 1600年 / 8卷 / 02期

关键词：

Cascading De-embedding; Fixture; Network Parameters; Odd-Even Ports; T-Parameters;

D O I：

10.1109/MEMC.2019.8753449

中图分类号：

学科分类号：

摘要：

Fixture de-embedding is a technique to remove unwanted effect of the fixtures from a total measurement. Fixture de-embedding includes two steps: first S-Parameters of left and right fixtures are obtained and then they are de-embedded from left and right sides of measured scattering matrix. De-embedding techniques are well known when a network have even number of ports, i.e. when number of input and output ports are equal. In the present paper we propose a technique to generalize de-embedding algorithm for network parameters with odd number of ports. © 2012 IEEE.

引用

页码：75 / 80

页数：5

共 7 条

[1] Barnes H., Bogatin E., Moreria J., Ellison J., Nadolny J., Huang C.C., Tsiklauri M., Moon S.J., Herrmann V., A nist traceable PCB kit for evaluating the accuracy of de-embedding algorithms and corresponding metrics, DesignCon 2018
[2] Yoon Ch., Tsiklauri M., Zvonkin M., Fan J., Drewniak J.L., Razmadze A., Aflaki A., Kim J., Chen Q., Design criteria of automatic fixture removal (AFR) for asymmetric fixture de-embedding, 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC), pp. 654-659, (2014)
[3] Chen B., Tsiklauri M., Wu Ch., Jin Sh., Fan J., Ye X., Samaras B., Analytical and numerical sensitivity analyses of fixtures de-embedding, 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC), pp. 440-444, (2016)
[4] De Paulis F., Zhang Y.-J., Fan J., Signal/Power integrity analysis for multilayer printed circuit boards using cascaded S-parameters, IEEE Transaction on Electromagnetic Compatibility, 52, 4, pp. 1008-1018, (2010)
[5] Wu C., Chen B., Mikheil T., Fan J., Ye X., Error bounds analysis of deembedded results in 2x thru de-embedding methods, 2017 IEEE International Symposium on Electromagnetic Compatibility &Signal/Power Integrity (EMCSI), pp. 532-536, (2017)
[6] Bianchi G., Moreira J., Quint A., A review of combiner/divider PCB design topologies for 5g and wigig ate applications, DesignCon, (2019)
[7] Barnes H., Moreira J., Verifying the accuracy of 2x-thru de-embedding for unsymmetrical test fixtures, 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS), pp. 1-3, (2017)

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