Keep Attention to the Mapping: Application of AI for Geometric X-Ray CT Scan Calibration

被引：0
|
作者：
Wittl, Simon [1 ]
Weiss, Anton [1 ]
Herl, Gabriel [1 ]
Zabler, Simon [1 ]
机构：
[1] Technische Hochschule Deggendorf, Dieter-Görlitz-Platz 1, Deggendorf,94469, Germany
来源：
e-Journal of Nondestructive Testing | 2023年 / 28卷 / 03期
关键词：
Compendex;
D O I：
10.58286/27747
中图分类号：
学科分类号：
摘要：
Calibration
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