A novel nuclear radiation cumulant sensor based on spintronic memristor

被引:0
作者
Wen, Changbao [1 ]
Xu, Li [1 ]
Zha, Jun [1 ]
Zhou, Chenglong [1 ]
机构
[1] School of Electronic information, Chang'an University, Xi'an,710064, China
基金
中国国家自然科学基金;
关键词
Radiation effects - Resistors;
D O I
暂无
中图分类号
TN3 [半导体技术]; TN4 [微电子学、集成电路(IC)];
学科分类号
0805 ; 080501 ; 080502 ; 080903 ; 1401 ;
摘要
A designed scheme combining nuclear radiation cumulant sensor with spintronic memristor is proposed. The sensor circuit mainly consists of nuclear radiation converter, spintronic memristor array, current limiting resistor, amplifier. In the presence of nuclear radiation, the nuclear radiation converter will generate photocurrent and cause changes in current and charge in the circuit, which will cause changes in the resistance of the spintronic memristor array in the circuit. Therefore, according to the memory and resistance feature of the spintronic memristor, the nuclear radiation cumulant of the object irradiated for a period of time can be expressed by the spintronic memristor array resistance value. At the same time, we use the threshold of feature to eliminate the influence of dark current in the measurement and achieve the measurement of nuclear radiation cumulant. In order to verify the designed sensor, experiments were carried out under no nuclear radiation, constant and randomly varying radiation intensities, and the effects of memory resistor array intersection and amplifier gain on the sensor were analyzed. The experimental results show that the designed nuclear radiation cumulant sensor based on the spintronic memristor array can complete the measurement of nuclear radiation cumulant. When the nuclear radiation intensity is 1 mGy/h, the nuclear radiation measurement range of the sensor is 0–3.2 mGy, and the sensitivity is 1251.47 Ω/mGy. The change of nuclear radiation intensity will affect the change speed of the resistance value of the spintronic memristor, but it does not affect the measuring range and sensitivity of the sensor. © 2022 Elsevier B.V.
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