Dynamical sound speed and structural inhomogeneity in liquid Te studied by inelastic x-ray scattering

被引:0
作者
Inui M. [1 ]
Kajihara Y. [1 ]
Hosokawa S. [2 ]
Matsuda K. [3 ]
Tsuchiya Y. [4 ]
Tsutsui S. [5 ]
Baron A.Q.R. [6 ]
机构
[1] Graduate School of Integrated Arts and Sciences, Hiroshima University, Higashi-Hiroshima, Hiroshima
[2] Department of Physics, Kumamoto University, Kumamoto
[3] Graduate School of Science, Kyoto University, Kyoto
[4] Faculty of Science, Niigata University, Niigata
[5] Japan Synchrotron Radiation Research Institute (JASRI), Sayo, 679-5198, Hyogo
[6] Materials Dynamics Laboratory, RIKEN SPring-8 Center, Sayo, 679-5148, Hyogo
基金
日本学术振兴会;
关键词
Atomic dynamics; Collective mode; Inelastic x-ray scattering; Liquid chalcogen; Semiconductor-metal transition;
D O I
10.1016/j.nocx.2018.100006
中图分类号
学科分类号
摘要
Inelastic x-ray scattering measurements using high-pressure apparatus were carried out for liquid Te up to 1673 K above the boiling point at the normal pressure. We could obtain the dynamic structure factor S(Q,E) of good quality at 1.8 ≤ Q ≤ 22 nm −1 . Although the excitation energies of the acoustic mode are fluctuating more at lower temperatures, we found that the dynamical sound speed at 1.8 and 2.1 nm −1 becomes fast with increasing temperature from 773 to 923 K, similarly to the temperature dependence of ultrasonic sound speed in liquid Te. Despite this unusual temperature dependence at the lowest Q, the sound speed at higher Q is consistent with those obtained by the previous inelastic neutron and x-ray scattering studies, in which the dynamical sound just slows down with increasing temperature. The present results may be correlated with the temperature-driven semiconductor-metal transition in liquid Te, and if so, it is inferred that a domain size of inhomogeneity induced with the transition is comparable to the wave length corresponding to the lowest Q. © 2019 The Author(s)
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