High resolution threshold photoelectron spectrum and autoionization processes of S2 up to 15.0 eV

被引:0
|
作者
Hrodmarsson, Helgi Rafn [1 ]
Garcia, Gustavo A. [1 ]
Nahon, Laurent [1 ]
Loison, Jean-Christophe [2 ]
Gans, Bérenger [3 ]
机构
[1] Synchrotron SOLEIL, L'Orme des Merisiers, St Aubin, BP 48, Gif sur Yvette, France
[2] ISM, Université Bordeaux 1, CNRS, 351 cours de la Libération, 33405, Talence Cedex, France
[3] Institut des Sciences Moléculaires d'Orsay, CNRS, Université Paris-Saclay, 91405, Orsay, France
基金
欧盟地平线“2020”;
关键词
Synchrotron radiation - Photoelectrons - Photons - Photoionization - Ground state - Rydberg states - Electronic states;
D O I
暂无
中图分类号
学科分类号
摘要
VUV photoionization dynamics of the S2 molecule were re-investigated from threshold up to 15.0 eV, using synchrotron radiation coupled with double imaging photoelectron/photoion coincidence featuring high resolution capabilities. We measured the first threshold photoelectron spectrum of S2 achieving higher resolution than previous literature to derive accurate spectroscopic constants for a few electronic states of the cation including the X2ΠΩ,g ground state and the a4Πu, b4Σg–, and B2Σg– states. We also recorded the total ion yield for S2 up to a photon energy of 15.0 eV which, combined with the threshold photoelectron spectrum, led to the assignment of various autoionizing Rydberg series. © 2021
引用
收藏
相关论文
共 50 条
  • [41] HIGH-RESOLUTION ANGLE-RESOLVED PHOTOELECTRON-SPECTRUM OF THE B2-SIGMA-U+ STATE IN CO-2+
    WANNBERG, B
    VEENHUIZEN, H
    MATTSSON, L
    NORELL, KE
    KARLSSON, L
    SIEGBAHN, K
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1984, 17 (08) : L259 - L264
  • [42] THE HIGH-RESOLUTION PHOTOELECTRON-SPECTRUM OF N2O - THE APPROXIMATELY-B(2-PI-I) STATE
    CVITAS, T
    KLASINC, L
    KOVAC, B
    MCDIARMID, R
    JOURNAL OF CHEMICAL PHYSICS, 1983, 79 (04): : 1565 - 1568
  • [43] STUDY OF A HIGH-RESOLUTION SPECTRUM OF THE 5ν2 BAND OF THE H2S MOLECULE
    Zhang, F.
    Glushkov, P. A.
    Bekhtereva, E. S.
    RUSSIAN PHYSICS JOURNAL, 2020, 63 (07) : 1296 - 1298
  • [44] Study of a High-Resolution Spectrum of the 5ν2 Band of the H2S Molecule
    F. Zhang
    P. A. Glushkov
    E. S. Bekhtereva
    Russian Physics Journal, 2020, 63 : 1296 - 1298
  • [45] Conjugate photoelectron recapture peaks in the high resolution Auger electron spectra following near-threshold Ar 2p photoionization
    Kosugi, S.
    Martins, J.
    Hosseini, F.
    Marchenko, T.
    Travnikova, O.
    Bozek, J. D.
    Ito, K.
    Sokell, E.
    Piancastelli, M. N.
    Simon, M.
    Koike, F.
    Azuma, Y.
    JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2020, 53 (12)
  • [46] INELASTIC-SCATTERING AND SATELLITE FINE-STRUCTURE IN THE HIGH-RESOLUTION UV PHOTOELECTRON-SPECTRUM OF CS2
    REINECK, I
    WANNBERG, B
    VEENHUIZEN, H
    NOHRE, C
    MARIPUU, R
    NORELL, KE
    MATTSSON, L
    KARLSSON, L
    SIEGBAHN, K
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1984, 34 (03) : 235 - 252
  • [47] High-resolution threshold-energy photoionization study of the Ne 2s-electron
    Wilhelmi, O
    Mentzel, G
    Zimmermann, B
    Schartner, KH
    Schmoranzer, H
    Vollweiler, F
    Lauer, S
    Liebel, H
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1999, 101 : 155 - 159
  • [48] THE HIGH-RESOLUTION INNER-VALENCE PHOTOELECTRON-SPECTRUM OF H2S INDUCED BY MONOCHROMATIC AL K-ALPHA X-RAYS
    ADAM, MY
    DEBRITO, AN
    KEANE, MP
    SVENSSON, S
    KARLSSON, L
    KALLNE, E
    CORREIA, N
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1991, 56 (03) : 241 - 257
  • [49] X-ray Photoelectron Spectrum and Electronic Properties of a Noncentrosymmetric Chalcopyrite Compound HgGa2S4: LDA, GGA, and EV-GGA
    Reshak, Ali Hussain
    Khenata, R.
    Kityk, I. V.
    Plucinski, K. J.
    Auluck, S.
    JOURNAL OF PHYSICAL CHEMISTRY B, 2009, 113 (17): : 5803 - 5808
  • [50] High-resolution C 1s photoelectron spectra of methane, ethene, propene, and 2-methylpropene
    Saethre, LJ
    Svaeren, O
    Svensson, S
    Osborne, S
    Thomas, TD
    Jauhiainen, J
    Aksela, S
    PHYSICAL REVIEW A, 1997, 55 (04): : 2748 - 2756