A bidirectional scattering function reconstruction method based on optimization of the distribution of microrelief normals

被引：0
作者：
Bogdanov N.N. [1 ]
Zhdanov A.D. [1 ]
Zhdanov D.D. [1 ]
Potyomin I.S. [1 ]
Sokolov V.G. [2 ]
Denisov E.Y. [2 ]
机构：
[1] ITMO University, Saint-Petersburg
[2] Keldysh Institute of Applied Mathematics (RAS), Moscow
来源：
Light and Engineering | 2019年 / 27卷 / 01期
基金：
俄罗斯基础研究基金会;
关键词：
Bidirectional scattering distribution function; Diffusion; Microrelief; Photoconductive systems; Ray optics; Rendering; Rough surface; Total internal reflection; Wave optics;
D O I：
10.33383/2017-098
中图分类号：
学科分类号：
摘要：
The paper is devoted to the development of a method for reconstructing the scattering properties of a rough surface. The rough surface, in this case, is the dielectric-air interface. Typically, these properties are described by the bidirectional scattering distribution function. Direct measuring of such functions is either impossible, or its cost is very high. The method of reconstructing the bidirectional scattering distribution function, based on the distribution of the elevations of the microrelief, requires a complicated fitting procedure and often yields not very good results. In the proposed solution, the rough surface is modelled by a parametric function that simulates the density distribution of the normals to the faces of the surface microrelief. The result of optimizing the density distribution of the normals to the faces of the surface microrelief is in good agreement with the expected one. © 2019, LLC Editorial of Journal “Light Technik”. All rights reserved.
引用
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页码：25 / 32
页数：7
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