Synthesis and characterization of hexagonal and tetrahedral nanocrystalline Sb2O3 thin films prepared by chemical spray pyrolysis technique

被引：14
作者：
Shinde Y.P. [1 ,2 ]
Sonone P.N. [2 ]
Ubale A.U. [2 ]
机构：
[1] S B Jain Institute of Technology, Management and Research, Nagpur, 441501, Maharashtra
[2] Nanostructured Thin Film Materials Laboratory, Department of Physics, Govt. Vidarbha Institute of Science and Humanities, VMV Road, Amravati, 444604, Maharashtra
来源：
Journal of Alloys and Compounds | 2020年 / 831卷
关键词：
Electrical properties; Nanostructured; Optical properties; Sb[!sub]2[!/sub]O[!sub]3[!/sub] thin films prepared by chemical spray pyrolysis;
D O I：
10.1016/j.jallcom.2020.154777
中图分类号：
学科分类号：
摘要：
Nanocrystalline hexagonal and tetrahedral shape Sb2O3 thin films of different concentrations have been successfully deposited onto glass substrates using chemical spray pyrolysis technique for the first time. The structural, morphological and compositional studies were carried out using X-ray diffractometer (XRD), field emission scanning electron microscope (FESEM) and energy dispersive X-ray analysis (EDAX) respectively. The structural studies revealed that, deposited Sb2O3 thin films have polycrystalline nature having cubic senarmontite structure. The morphological and compositional studies revealed that deposited materials have hexagonal and tetrahedral shape which showing excellent agreement with theoretical composition. The optical characterization shows that deposited Sb2O3 exhibited direct band gap which varied from 3.43 to 3.71 eV depending upon the concentration of spray solution. Electrical resistivity of the Sb2O3 thin film decreases with an increase in temperature indicating the semiconducting nature. The activation energy of the film is found to be varying from 0.764 to 0.798 eV depending upon the concentration of spray solution. © 2020 Elsevier B.V.
引用
收藏
相关论文
共 31 条
  • [11] Behera S.N., Patel B.K., Sahu S.N., Et al., Phase Transitions, 75, (2002)
  • [12] Niu L., Xu J., Yang W., Zhao J., Su J., Guo Y., Liu X., Ferroelectrics, 523, pp. 14-21, (2018)
  • [13] Cox D.M., Trevor D.J., Whetten R.L., Rohling E.A., Kaldor A., Phys. Rev. B, 32, (1985)
  • [14] Haberland H., Insepov Z., Moseler M., Phys. Rev. B, 51, (1995)
  • [15] Fuchs G., Melinon P., Santos Aires F., Et al., Phys. Rev. B, 44, (1991)
  • [16] Tan Y., Chan L., Chen H., Hou Q., Chen X., Mater. Lett. X, 17, (2017)
  • [17] Li X., Qu J., Xie H., Song Q., Fu G., Yin H., Electrochim. Acta, 332, (2020)
  • [18] Deng M., Li S., Hong W., Jiang Y., Xu W., Shuai H., Zou G., Hu Y., Hou H., Wang W., Ji X., Mater. Chem. Phys., 223, pp. 46-52, (2019)
  • [19] Wang Y., Jiang L., Liu Y., Ding T., Liu F., Lai Y., J. Alloys Compd., 727, pp. 469-474, (2017)
  • [20] Wang L., Wang Z., Sun Y., Liang X., Xiang H., J. Membr. Sci., 572, pp. 512-519, (2019)
1234