The Principles of FIB and Serial Sectioning

被引：0
作者：
Onishi T.
机构：
来源：
Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering | 2023年 / 89卷 / 06期
关键词：
BSE; curtaining; FIB; FIB-AD; FIB-SEM; ICP; LMIS; micro-sampling; plasma; SE; segmentation; SIM; sputtering;
D O I：
10.2493/jjspe.89.436
中图分类号：
学科分类号：
摘要：
[No abstract available]
引用
收藏
页码：436 / 439
页数：3
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