Insulator Surface Charge Measurement Using an Improved Capacitive Probe

被引：0
|
作者：
汪沨 [1 ]
邱毓昌 [2 ]
李欣然 [3 ]
PFEIFFER W [4 ]
KUFFEL E [5 ]
机构：
[1] State Key Lab for Electrical Insulation and Apparatus, Xi'an Jiaotong University, Xi'an , China School of Electrical and Information Engineering, Hunan University, Changsha , China
[2] State Key Lab for Electrical Insulation and Apparatus, Xi'an Jiaotong University, Xi'an , China
[3] School of Electrical and Information Engineering, Hunan University, Changsha , China
[4] Technische Universitat Darmstadt, Darmstadt, Germany
[5] Dept of Electrical Engineering and Computer Science, University of Manitoba, Winnipeg,
来源：
Plasma Science and Technology | 2006年 / 8卷 / 05期
关键词：
D O I：
暂无
中图分类号：
O462 [阴极电子学];
学科分类号：
摘要：
<正> A surface charge measuring system using the capacitive probe method is analysed. The present study shows that the measuring system cannot have a steady-state output and that the error resulting from the finite leakage resistance of the measuring system will be accumulated during the measuring process. Based on the theoretical analysis a new type probe with a low charge leakage and high resolution is designed. The surface charge accumulated on the Teflon insulator under a DC voltage is measured using this new probe and some phenomena of the surface charging are reported.
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页码：565 / 568
页数：4
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