PAL-YOLOv8: A Lightweight Algorithm for Insulator Defect Detection

被引:1
作者
Zhang, Du [1 ]
Cao, Kerang [2 ]
Han, Kai [3 ]
Kim, Changsu [1 ]
Jung, Hoekyung [1 ]
机构
[1] Pai Chai Univ, Dept Comp Sci & Engn, 155-40 Baejae Ro, Daejeon 35345, South Korea
[2] Shenyang Univ Chem Technol, Coll Comp Sci & Technol, Key Lab Intelligent Technol Chem Proc Ind Liaoning, Shenyang 110142, Peoples R China
[3] Woosong Univ, Dept Int Business Adm, 171 Dong daejeon Ro, Daejeon 34606, South Korea
关键词
insulator defect detection; YOLOv8n; PKINet; Focaler-SioU; pruning;
D O I
10.3390/electronics13173500
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
To address the challenges of high model complexity and low accuracy in detecting small targets in insulator defect detection using UAV aerial imagery, we propose a lightweight algorithm, PAL-YOLOv8. Firstly, the baseline model, YOLOv8n, is enhanced by incorporating the PKI Block from PKINet to improve the C2f module, effectively reducing the model complexity and enhancing feature extraction capabilities. Secondly, Adown from YOLOv9 is employed in the backbone and neck for downsampling, which retains more feature information while reducing the feature map size, thus improving the detection accuracy. Additionally, Focaler-SIoU is used as the bounding-box regression loss function to improve model performance by focusing on different regression samples. Finally, pruning is applied to the improved model to further reduce its size. The experimental results show that PAL-YOLOv8 achieves an mAP50 of 95.0%, which represents increases of 5.5% and 2.6% over YOLOv8n and YOLOv9t, respectively. Furthermore, GFLOPs is only 3.9, the model size is just 2.7 MB, and the parameter count is only 1.24 x 106.
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页数:20
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