Microwave photonics frequency scanning approach to absolute distance measurement

被引：0
|
作者：
Zhang, Zhen [1 ]
Kang, Jiehu [1 ]
Liu, Ruihao [1 ]
Cao, Yulei [1 ]
Sun, Zefeng [1 ]
Feng, Luyuan [1 ]
Wu, Bin [1 ]
机构：
[1] Tianjin Univ, State Key Lab Precis Measurement Technol & Instrum, Tianjin 300072, Peoples R China
来源：
OPTICS AND LASERS IN ENGINEERING | 2024年 / 183卷
基金：
中国国家自然科学基金;
关键词：
Microwave photonics; Frequency scanning; Absolute distance measurement; Intensity modulation; Interference spectrum; INTERFEROMETRY;
D O I：
10.1016/j.optlaseng.2024.108527
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
An absolute distance measurement approach based on microwave photonics is proposed to provide a highresolution and non-ambiguity range measurement solution by microwave frequency scanning. The microwave interference spectrum containing optical path difference information can be generated through two rounds of intensity modulation. The approach combines the characteristics of easy focusing and collimation of light waves, as well as easy manipulation of microwaves, to achieve accurate absolute distance measurement. The experimental results show that high-precision measurements can be achieved within the frequency scanning range of only 2 GHz. The error of the distance measurement is less than +/- 0.079 mm. In addition, the effectiveness of the scanning pattern and the data processing algorithm are verified.
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收藏
页数：7
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