The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffraction

被引:0
|
作者
Gholam, Saleh [1 ]
Hadermann, Joke [1 ]
机构
[1] Univ Antwerp, EMAT, Groenenborgerlaan 171, B-2020 Antwerp, Belgium
关键词
3D electron diffraction (3DED); Structure solution; Structure refinement; Transmission electron microscope (TEM); ELECTRON-DIFFRACTION;
D O I
10.1016/j.ultramic.2024.114022
中图分类号
TH742 [显微镜];
学科分类号
摘要
Nowadays, 3D Electron Diffraction (3DED) is widely used for the structure determination of sub-micron-sized particles. In this work, we investigate the influence of the acceleration voltage on the quality of 3DED datasets acquired on BaTiO3 nanoparticles. Datasets were acquired using a wide range of beam energies, from common, high acceleration voltages (300 kV and 200 kV) to medium (120 kV and 80 kV) and low acceleration voltages (60 kV and 30 kV). It was observed that, in the integration process, Rintincreases as the beam energy is reduced, which is mainly due to the increased dynamical scattering. Nevertheless, the structure was solved successfully in all cases. The structure refinement was comparable for all beam energies with small deficiencies such as negative atomic displacements for the heaviest atom in the structure, barium. Including extinction correction in the refinement noticeably improved the model for low acceleration voltages, probably due to higher beam absorption in these cases. Dynamical refinement, however, shows superior results for higher acceleration voltages, since the dynamical refinement calculations currently ignore inelastic scattering effects.
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页数:10
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