The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffraction

被引:0
|
作者
Gholam, Saleh [1 ]
Hadermann, Joke [1 ]
机构
[1] Univ Antwerp, EMAT, Groenenborgerlaan 171, B-2020 Antwerp, Belgium
关键词
3D electron diffraction (3DED); Structure solution; Structure refinement; Transmission electron microscope (TEM); ELECTRON-DIFFRACTION;
D O I
10.1016/j.ultramic.2024.114022
中图分类号
TH742 [显微镜];
学科分类号
摘要
Nowadays, 3D Electron Diffraction (3DED) is widely used for the structure determination of sub-micron-sized particles. In this work, we investigate the influence of the acceleration voltage on the quality of 3DED datasets acquired on BaTiO3 nanoparticles. Datasets were acquired using a wide range of beam energies, from common, high acceleration voltages (300 kV and 200 kV) to medium (120 kV and 80 kV) and low acceleration voltages (60 kV and 30 kV). It was observed that, in the integration process, Rintincreases as the beam energy is reduced, which is mainly due to the increased dynamical scattering. Nevertheless, the structure was solved successfully in all cases. The structure refinement was comparable for all beam energies with small deficiencies such as negative atomic displacements for the heaviest atom in the structure, barium. Including extinction correction in the refinement noticeably improved the model for low acceleration voltages, probably due to higher beam absorption in these cases. Dynamical refinement, however, shows superior results for higher acceleration voltages, since the dynamical refinement calculations currently ignore inelastic scattering effects.
引用
收藏
页数:10
相关论文
共 50 条
  • [31] Structure Determination of Embedded Precipitates by Precession Electron Diffraction and Synchrotron Radiation: A Comparison
    Hansen, Vidar
    Kverneland, Atle
    Larsen, Helge Bovik
    Pattison, Philip
    Vincent, Roger
    Gjonnes, Jon
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2005, 61 : C458 - C458
  • [32] Quantitative 3D electron diffraction data by precession and electron rotation methods
    Hovmoller, Sven
    Oleynikov, Peter
    Sun, Junliang
    Zhang, Daliang
    Zou, Xiaodong
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C76 - C76
  • [33] Automated quantitative 3d electron diffraction rotation tomography
    Oleynikov, Peter
    Hovmoller, Sven
    Zou, Xiaodong
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2011, 67 : C175 - C176
  • [34] Collecting 3D electron diffraction data by the rotation method
    Zhang, Daliang
    Oleynikov, Peter
    Hovmoller, Sven
    Zou, Xiaodong
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS, 2010, 225 (2-3): : 94 - 102
  • [35] Structure Determination Feasibility of Three-Dimensional Electron Diffraction in Case of Limited Data
    Das, Partha Pratim
    Plana-Ruiz, Sergi
    Galanis, Athanassios S. S.
    Stewart, Andrew
    Karavasili, Fotini
    Nicolopoulos, Stavros
    Putz, Holger
    Margiolaki, Irene
    Calamiotou, Maria
    Iezzi, Gianluca
    SYMMETRY-BASEL, 2022, 14 (11):
  • [36] Unraveling unforeseen disorders in silicates with 3D electron diffraction
    Cho, Jungyoun
    Zou, Xiaodong
    Willhammar, Tom
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2021, 77 : C1283 - C1283
  • [37] Protein structure determination by electron diffraction using a single three-dimensional nanocrystal
    Clabbers, M. T. B.
    van Genderen, E.
    Wan, W.
    Wiegers, E. L.
    Gruene, T.
    Abrahams, J. P.
    ACTA CRYSTALLOGRAPHICA SECTION D-STRUCTURAL BIOLOGY, 2017, 73 : 738 - 748
  • [38] Crystal structure determination of a ternary Cu(In,Sn)2 intermetallic phase by electron diffraction
    Lopez, Gabriel A.
    San Juan, Jose
    No, Maria L.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2012, 45 : 963 - 971
  • [39] 3D Electron diffraction for the discovery of new crystal forms of APIs
    Lanza, A. E.
    Potticary, J.
    Hall, C.
    Hamilton, V.
    Hall, S. R.
    Santiso-Quinones, G.
    Steinfeld, G.
    Hovestreydt, E.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2021, 77 : C879 - C879
  • [40] Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction data
    Own, CS
    Sinkler, W
    Marks, LD
    ULTRAMICROSCOPY, 2006, 106 (02) : 114 - 122