Electron emission from HfC(100) single-crystal tip

We investigated electron emission characteristics of a hafnium carbide [HfC(100)] single-crystal tip at various temperatures toward finding a candidate of the next generation of emitters for electron microscopes. The emission mode changed from cold-field emission (CFE) to low-temperature and high-temperature thermal-field emission and, finally, to extended Schottky emission. The energy width at full width of half maximum of the emitted electrons was 0.2 eV in the CFE mode at an angular current of 20 mu A/sr, and it showed good emission stability with current noise less than 3.5% in an electron gun of a scanning electron microscope (SEM). Spatial resolution of the SEM at an acceleration voltage of 0.5 kV improved 14% by using the HfC(100)-CFE tip instead of a conventional W(310)-CFE tip. High monochromaticity and stable electron emission of the HfC(100)-CFE tip are suitable for the next generation of emitters for ultrahigh-resolution field emission SEMs.