Optical analysis of ferrite films using spectroscopic ellipsometry

This work presents the optical properties of nickel zinc ferrite, nickel copper zinc ferrite, and nickel cobalt zinc ferrite films prepared on Si/SiO2 substrates using the sol-gel and spin-coating technique. A J.A. Woollam Company RC2 model D variable angle spectroscopic ellipsometer was used to measure the amplitude ratio (Psi) and phase difference (Delta) of the films annealed at two distinct temperatures (500 and 800 degrees C). Measurements were taken at three incident angles (55 degrees, 65 degrees, and 75 degrees) across the spectral range of 190-1000 nm, with a step size of 1 nm. The acquired data were subjected to modeling using a summation of Kramers-Kronig consistent oscillators to determine the film thickness and complex optical functions (refractive index and extinction coefficient) with a minimized mean-squared error. Additionally, incorporating a surface roughness layer notably enhanced the accuracy, with the roughness described using the Bruggeman effective medium approximation reflecting a 50%-50% mixture between the film's optical constants and those of air (void). The experimental and simulated (Psi, Delta) spectra as a function of wavelength at angles 55 degrees, 65 degrees, and 75 degrees for the NZF, NCuZF, and NCoZF films annealed at 500 and 800 degrees C are provided. The refractive index and extinction coefficient values as a function of wavelength for NZF, NCuZF, and NCoZF films annealed at 500 and 800 degrees C are also included. The elucidated optical properties of these films hold potential for application in various optoelectronic devices, including solar cells.