The Etching Behaviour and Fluorine-Based-Plasma Resistance of YOF Coatings Deposited by Atmospheric Plasma Spraying

被引:1
|
作者
Tang, Zaifeng [1 ,2 ]
Wang, Yuwei [2 ]
Ang, Kaiqu [2 ]
Xu, Jin [2 ]
Meng, Hua [2 ]
Chen, Hongli [3 ]
Wei, Yuxuan [3 ]
Shi, Ying [1 ]
Wang, Linjun [1 ,4 ,5 ]
机构
[1] Shanghai Univ, Sch Mat Sci & Engn, 333 Nanchen Rd, Shanghai 200444, Peoples R China
[2] Shanghai Huali Integrated Circuit Corp, 6 Liangteng Rd, Shanghai 201314, Peoples R China
[3] Chongqing Genori Technol Co Ltd, 66 Sendi Ave, Chongqing 401326, Peoples R China
[4] Shanghai Collaborat Innovat Ctr Intelligent Sensin, Shanghai 201800, Peoples R China
[5] Shanghai Univ, Zhejiang Inst Adv Mat, Jiashan 314113, Peoples R China
关键词
fluorine-based plasma; etching; yttrium oxyfluoride (YOF); atmospheric plasma spraying (APS); Y2O3;
D O I
10.3390/coatings14091091
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
There is a high demand for plasma-resistant coatings that prevent the corrosion of the internal ceramic components of plasma etching equipment, thereby reducing particle contamination and process drift. Yttrium oxyfluoride (YOF) coatings were prepared using atmospheric plasma spraying (APS) with commercially available YOF/YF3 powder mixtures; namely YOF 3%, YOF 6%, and YOF 9%. The etching behaviour of YOF and yttrium oxide (Y2O3) coatings was investigated using an inductively coupled plasma consisting of NF3/He. X-ray photoelectron spectroscopy (XPS) showed that the YOF 6% coating had the thickest fluorinated layer. The scanning electron microscope (SEM) examination revealed that the YOF 6% coating showed exceptional resistance to erosion and generated a reduced quantity of contaminated particles in comparison to Y2O3. Consequently, it is more suitable as a protective material for the inner wall of reactors. The YOF coatings exhibit excellent stability and high resistance to erosion, indicating their appropriateness for use in the semiconductor industry.
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页数:11
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