Scanning Probe Microscopy of Halide Perovskite Solar Cells

被引：0

作者：

Lee, Minwoo ^{[1
]}

Wang, Lei ^{[2
]}

Zhang, Dawei ^{[2
,3
]}

Li, Jiangyu ^{[4
]}

Kim, Jincheol ^{[2
,5
]}

Yun, Jae Sung ^{[1
,6
]}

Seidel, Jan ^{[2
,3
]}

机构：

[1] Univ New South Wales, Australian Ctr Adv Photovolta ACAP, Sch Photovolta & Renewable Energy, Sydney, NSW 2052, Australia

[2] UNSW Sydney, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia

[3] UNSW Sydney, ARC Ctr Excellence Future Low Energy Elect Technol, Sydney, NSW 2052, Australia

[4] Southern Univ Sci & Technol, Dept Mat Sci & Engn, Shenzhen 518055, Guangdong, Peoples R China

[5] Macquarie Univ, Sch Engn, Sydney, NSW 2109, Australia

[6] Univ Surrey, Adv Technol Inst ATI, Sch Comp Sci & Elect Engn, Guildford GU2 7XH, Surrey, England

来源：

ADVANCED MATERIALS | 2024年 / 36卷 / 42期

基金：

新加坡国家研究基金会;

关键词：

halide perovskites; photovoltaics; scanning probe microscopy; solar cells; METHYLAMMONIUM LEAD IODIDE; GRAIN-BOUNDARIES; PHASE-TRANSITIONS; HIGH-PERFORMANCE; ION MIGRATION; THIN-FILMS; TRANSPORT; FERROELECTRICITY; CH(3)NH(3)PBL(3); ACCUMULATION;

D O I：

10.1002/adma.202407291

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Scanning probe microscopy (SPM) has enabled significant new insights into the nanoscale and microscale properties of solar cell materials and underlying working principles of photovoltaic and optoelectronic technology. Various SPM modes, including atomic force microscopy, Kelvin probe force microscopy, conductive atomic force microscopy, piezoresponse force microscopy, and scanning near-field optical microscopy, can be used for the investigation of electrical, optical and chemical properties of associated functional materials. A large body of work has improved the understanding of solar cell device processing and synthesis in close synergy with SPM investigations in recent years. This review provides an overview of SPM measurement capabilities and attainable insight with a focus on recently widely investigated halide perovskite materials.

引用

页数：23

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