Wavelike Periodic Structures on the Silicon Surface Initiated by Irradiation with a Focused Gallium Ion Beam

被引:1
|
作者
Bachurin, V. I. [1 ]
Smirnova, M. A. [1 ]
Lobzov, K. N. [1 ]
Lebedev, M. E. [1 ]
Mazaletsky, L. A. [1 ]
Pukhov, D. E. [1 ]
Churilov, A. B. [1 ]
机构
[1] Russian Acad Sci, Yaroslavl Branch, Valiev Inst Phys & Technol, Yaroslavl 150067, Russia
来源
JOURNAL OF SURFACE INVESTIGATION | 2024年 / 18卷 / 04期
关键词
sputtering; wavelike relief; focused ion beam; PATTERN-FORMATION; TOPOGRAPHY DEVELOPMENT; ANGULAR DEPENDENCES; RIPPLE TOPOGRAPHY;
D O I
10.1134/S1027451024700514
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We investigate the processes of microrelief formation on a Si(100) surface under irradiation with a Ga+-ion beam with an energy of 30 keV and a fluence of D = 1.25 x 10(18)-2 x 10(19) cm(-2) at incident angles of theta = 30 degrees-85 degrees. Within the angular range of theta = 40 degrees-70 degrees, a faceted wavy relief forms on the Si surface, while at theta = 30 degrees, a sinusoidal relief develops. An experimental dependence of the periodic structure wavelength as a function of irradiation time lambda(t) similar to t (n), where n = 0.33-0.35, is obtained. The average values of relief propagation velocities and their direction relative to the incident ion direction are determined for theta = 30 degrees and 40 degrees, amounting to -5.3 +/- 0.6 and -6.3 +/- 0.6 nm s(-1), respectively. The results are discussed in detail within the framework of existing models of wavelike surface relief formation under ion bombardment.
引用
收藏
页码:822 / 833
页数:12
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