Monolithic Control and Drive Blocks of AlGaN/GaN MIS-HEMTs for DC-DC Buck Converters

被引:0
|
作者
Cui, Pengju [1 ,2 ]
Li, Ang [3 ,4 ]
Zhu, Yuhao [1 ,2 ]
Li, Fan [1 ,2 ]
Sun, Ruize [5 ]
Liu, Wen [1 ,2 ]
机构
[1] Xian Jiaotong Liverpool Univ, Sch Adv Technol, Dept Elect & Elect Engn, Suzhou 215123, Peoples R China
[2] Univ Liverpool, Dept Elect Engn & Elect, Liverpool L69 3GJ, England
[3] Univ Sci & Technol China, Sch Nanotech & Nanob, Hefei 230026, Peoples R China
[4] Chinese Acad Sci, Suzhou Inst Nanotech & Nanob, Nanofabricat Facil, Suzhou 215123, Peoples R China
[5] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Device, Chengdu 610054, Peoples R China
基金
中国国家自然科学基金;
关键词
DC-DC power converter; gallium nitride (GaN); gate driver; metal-insulator-semiconductor high-electron-mobility transistor (MIS-HEMT); pulsewidth modulation (PWM) signal generator; THRESHOLD VOLTAGE; GAN; TECHNOLOGY; COMPARATOR;
D O I
10.1109/TED.2024.3434769
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This study introduces a compact gallium nitride (GaN) dc-dc power converter that uses metal-insulator-semiconductor high-electron-mobility transistors (MIS-HEMTs) in a confined space measuring 1.2 mm(2). By modulating the threshold voltages and optimizing the slew rate, the GaN converter incorporates control and drive blocks that function efficiently at a frequency of 500 kHz. The versatile pulsewidth modulation (PWM) signal generator is a crucial element that generates output waveforms with varying duty cycles (ranging from 30% to 70%) and stable 5.3-V amplitude and ensures proper operation of the gate driver and power HEMT while simplifying input signal requirements and providing precise control over the output voltage. The experimental results confirm the effectiveness of the proposed All-GaN integrated circuit (IC), showcasing its appropriateness for application in power electronics.
引用
收藏
页码:5597 / 5602
页数:6
相关论文
共 50 条
  • [41] Comparative study on nitridation and oxidation plasma interface treatment for AlGaN/GaN MIS-HEMTs with AlN gate dielectric
    Zhu, Jie-Jie
    Ma, Xiao-Hua
    Hou, Bin
    Chen, Li-Xiang
    Zhu, Qing
    Hao, Yue
    MATERIALS RESEARCH EXPRESS, 2017, 4 (02):
  • [42] DC, RF, and microwave noise performances of AlGaN/GaN HEMTs on sapphire substrates
    Lu, W
    Kumar, V
    Schwindt, R
    Piner, E
    Adesida, I
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2002, 50 (11) : 2499 - 2504
  • [43] Low-temperature characteristics and gate leakage mechanisms of LPCVD-SiNx/AlGaN/GaN MIS-HEMTs
    Guo, Hui
    Shao, Pengfei
    Bai, Haineng
    Zhou, Jian
    Peng, Yanghu
    Li, Songlin
    Xie, Zili
    Liu, Bin
    Chen, Dunjun
    Lu, Hai
    Zhang, Rong
    Zheng, Youdou
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2022, 55 (42)
  • [44] Improved Interface and Transport Properties of AlGaN/GaN MIS-HEMTs With PEALD-Grown AlN Gate Dielectric
    Zhu, Jie-Jie
    Ma, Xiao-Hua
    Xie, Yong
    Hou, Bin
    Chen, Wei-Wei
    Zhang, Jin-Cheng
    Hao, Yue
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015, 62 (02) : 512 - 518
  • [45] Anomalous DC Characteristics of AlGaN/GaN HEMTs Depending on Proton Irradiation Energies
    Kim, Dong-Seok
    Lee, Jun-Hyeok
    Kim, Jeong-Gil
    Yoon, Young Jun
    Lee, Jae Sang
    Lee, Jung-Hee
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2020, 9 (06)
  • [46] Instability of parasitic capacitance in T-shape-gate enhancement-mode AlGaN/GaN MIS-HEMTs
    Bi, Lan
    Yao, Yixu
    Jiang, Qimeng
    Huang, Sen
    Wang, Xinhua
    Jin, Hao
    Dai, Xinyue
    Xu, Zhengyuan
    Fan, Jie
    Yin, Haibo
    Wei, Ke
    Liu, Xinyu
    JOURNAL OF SEMICONDUCTORS, 2022, 43 (03)
  • [47] Low-Frequency Noise Characterization of AlGaN&x002F;GaN HEMTs and MIS-HEMTs Under UV Illumination
    Nagarajan, Venkatesan
    Chen, Kun-Ming
    Lin, Hsin-Yi
    Hu, Hsin-Hui
    Huang, Guo-Wei
    Lin, Chuang-Ju
    Chen, Bo-Yuan
    Anandan, Deepak
    Singh, Sankalp Kumar
    Wu, Chai-Hsun
    Chang, Edward Yi
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2020, 19 : 405 - 409
  • [48] Numerical simulation for DC Schottky gate leakage current in AlGaN/GaN HEMTs
    Rodriguez, R.
    Gonzalez, B.
    Garcia, J.
    Nunez, A.
    Toulon, G.
    Morancho, F.
    PROCEEDINGS OF THE 2018 12TH SPANISH CONFERENCE ON ELECTRON DEVICES (CDE), 2018,
  • [49] The effect of the barrier thickness on DC and RF performances of AlGaN/GaN HEMTs on silicon
    Wang, Chun
    Hsu, Heng-Tung
    Lin, Jui-Lung
    Weng, You-Chen
    Tsao, Yi-Fan
    Wang, Yuan
    Chang, Edward Yi
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2023, 38 (07)
  • [50] Charge Trapping in Gate-Drain Access Region of AlGaN/GaN MIS-HEMTs after Drain Stress
    Jauss, S. A.
    Schwaiger, S.
    Daves, W.
    Noll, S.
    Ambacher, O.
    ESSDERC 2015 PROCEEDINGS OF THE 45TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE, 2015, : 56 - 59