Test generation algorithm for QCA circuits targeting novel defects and its corresponding fault models

Considering the scaling limitations of current Complementary Metal Oxide Semiconductor (CMOS) technology, Quantum-dot-Cellular Automata (QCA) is emerging as one of the alternatives. QCA being at the molecular scale, defects are more likely to occur in it. Therefore, substantial development of QCA-oriented defects, its corresponding fault models and test generation is required. In this paper, a test generation algorithm for a QCA combinational circuit is proposed. The FAN (A Fanout Oriented) test generation algorithm is extended for QCA. The proposed Automatic Test Pattern Generator (ATPG) for QCA targets Single Stuck at Fault (SSF) set produced by novel Multiple Missing Cells (MMC) defects. The proposed ATPG is based on the QCA-oriented test generation properties and guided by proposed testability measures. The MCNC benchmark circuits are synthesized into QCA using proposed synthesis algorithms to check the effectiveness of the proposed ATPG. The ATPG is developed using C++and tested on MCNC benchmark circuits. Further, ATPG-generated test vectors are validated at the QCA device level to demonstrate their correctness. The QCA Designer-E tool is used for the device-level implementation of the MCNC benchmark circuit.