Emission dynamics of optically driven aluminum nitride quantum emitters

被引:3
作者
Guo, Yanzhao [1 ,2 ]
Hadden, John P. [1 ,2 ]
Clark, Rachel N. [1 ,2 ]
Bishop, Samuel G. [1 ,2 ]
Bennett, Anthony J. [1 ,2 ]
机构
[1] Cardiff Univ, Translat Res Hub, Maindy Rd, Cardiff CF24 4HQ, Wales
[2] Cardiff Univ, Sch Engn, Queens Bldg,Parade, Cardiff CF24 3AA, Wales
基金
欧盟地平线“2020”; 英国工程与自然科学研究理事会;
关键词
D O I
10.1103/PhysRevB.110.014109
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Aluminum nitride is a technologically important wide band-gap semiconductor which has been shown to host bright quantum emitters. We use photon emission correlation spectroscopy (PECS), time-resolved photoluminescence (TRPL), and state-population dynamic simulations to probe the dynamics of emission under continuous wave (CW) and pulsed optical excitation. We infer that there are at least four dark shelving states, which govern the TRPL, bunching, and saturation of the optical transition. We study in detail the emission dynamics of two quantum emitters (QEs) with differing power-dependent shelving processes, hypothesized to result from charge ionization and recombination. These results demonstrate that photon bunching caused by shelving the system in a dark state inherently limits the saturation rate of the photon source. In emitters where increasing optical power deshelves the dark states, we observe an increased photon emission intensity.
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页数:9
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