A Combination Method for Impedance Extraction of SMD Electronic Components Based on Full-Wave Simulation and De-Embedding Technique

The method of extracting impedance parameters of surface mounted (SMD) electronic components by test is suitable for components with unknown model or material information, but requires consideration of errors caused by non-coaxial and measurement fixtures. In this paper, a fixture for impedance measurement is designed according to the characteristics of passive devices, and the fixture de-embedding method is used to eliminate errors and improve the test accuracy. The method of obtaining S parameters of fixture based on full wave simulation proposed in this paper can provide a thought for obtaining S parameters in de-embedding. Taking a certain patch capacitor as an example, the S parameters for de-embedding were obtained using methods based on full wave simulation, 2xThru, x Thru, and ADS simulation, and de-embedding tests were conducted. The results indicate that obtaining the S parameter of the testing fixture based on full wave simulation and conducting de-embedding testing compared to ADS simulation can accurately extract the impedance parameters of SMD electronic components, which provides a reference for the study of electromagnetic interference (EMI) coupling mechanism.