First-principles investigation of positively charged and neutral oxygen vacancies in amorphous silica

被引:1
|
作者
Wang, Yuqi [1 ]
Zhao, Yaolin [1 ]
Chen, Zhongcun [2 ]
Jia, Ziqi [1 ]
Tong, Dayin [1 ]
Nie, Shaowei [1 ]
Han, Zitong [1 ]
机构
[1] Xi An Jiao Tong Univ, Sch Nucl Sci & Technol, Xian 710049, Peoples R China
[2] China Nucl Power Technol Res Inst, Shenzhen 518000, Peoples R China
来源
JOURNAL OF CHEMICAL PHYSICS | 2024年 / 161卷 / 03期
关键词
ELECTRON-SPIN-RESONANCE; DOSE-RATE SENSITIVITY; PARAMAGNETIC-RESONANCE; IRRADIATED QUARTZ; TRAPPED ELECTRONS; 1ST PRINCIPLES; E' CENTERS; E1; CENTER; DEFECTS; MECHANISMS;
D O I
10.1063/5.0206938
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The structural parameters, electron localization functions, electron paramagnetic resonance (EPR) parameters, formation energies, and thermodynamic transition levels of various oxygen vacancy defects in amorphous silica are comprehensively and integrally investigated by using density functional theory. The trends of changes in the oxygen vacancy defect structure and electron localization induced by the increase in distance between defective silicon atoms are clearly identified. It is shown that the dimer configuration may be the potential structure of the E-delta(') center. For the back-projected unpuckered configuration and the puckered configuration, whose EPR parameters are more consistent with the experimental values of the E-gamma(') center, the unpaired electron localized on the sp(3) hybridized silicon atom is a common feature. Due to the three-coordinated oxygen atom in the forward-oriented configuration, the EPR parameters are closest to those of the E(alpha)(' )center. Transformations of oxygen vacancy defects under different charge states are studied by sequentially adding and removing electrons. The thermodynamic transition level analysis reveals that the dimer and forward configurations may behave as deep traps for electron accumulation. The back-projected puckered fourfold-coordinated and fivefold-coordinated configurations are comparatively stable and may be able to function as shallow traps for electron transport. The neutral double unpuckered, neutral back-projected puckered fourfold-coordinated, and neutral back-projected unpuckered configurations are more likely to lose electrons during hole trapping. As the bias voltage is repeatedly changed, the defect density of the puckered configuration may reduce, while that of the dimer and unpuckered configuration may take an opposite trend.
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页数:13
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