Why Quality Control Matters: The Impact of Quality Metrics on Sequencing Results

被引:0
|
作者
Nitsche, Rainer [1 ]
Maus, Carsten [3 ]
Butler, Tim [2 ]
机构
[1] Agilent Technol, Waldbronn, Germany
[2] Agilent Technol, Ankeny, IA USA
[3] German Canc Res Ctr, Heidelberg, Germany
来源
JOURNAL OF MOLECULAR DIAGNOSTICS | 2024年 / 26卷 / 06期
关键词
D O I
暂无
中图分类号
R36 [病理学];
学科分类号
100104 ;
摘要
OTH-01
引用
收藏
页码:S60 / S61
页数:2
相关论文
共 50 条
  • [1] Why quality control matters - the impact of quality metrics on sequencing results
    Strauch, Bettina
    Maus, Carsten
    Butler, Tim
    Pechtl, Isabell
    EUROPEAN JOURNAL OF HUMAN GENETICS, 2024, 32 : 286 - 286
  • [2] Why quality matters
    Pearlman, S.
    JOURNAL OF PERINATOLOGY, 2015, 35 (05) : 311 - 312
  • [3] Why quality matters
    S Pearlman
    Journal of Perinatology, 2015, 35 : 311 - 312
  • [4] IS quality, metrics and impact
    Francalanci, Chiara
    Ravarini, Aurelio
    Management of the Interconnected World - ItAIS: The Italian Association for Information Systems, 2010,
  • [5] Why quality matters - Even to the publisher
    Bindslev, A
    Sundt, CS
    EUROPEAN JOURNAL OF SURGERY, 1997, 163 (04) : 243 - 244
  • [6] Water quality: Why geology matters
    Hamilton, PA
    Stoner, JD
    Gilliom, RJ
    GEOTIMES, 2000, 45 (06): : 20 - 23
  • [7] New Precision Metrics for Next Generation Sequencing Assay Quality Control
    Konigshofer, Y.
    Davis, L.
    Garlick, R. K.
    JOURNAL OF MOLECULAR DIAGNOSTICS, 2017, 19 (06): : 1058 - 1058
  • [8] Quality Matters: Boosting Face Presentation Attack Detection With Image Quality Metrics
    Liu, Xinwei
    Wang, Renfang
    Liu, Wen
    Zhang, Liangbin
    Wang, Xiaoxia
    IEEE ACCESS, 2024, 12 : 94654 - 94672
  • [9] Quality matters: Metrics and benchmarking of academic nursing organizations
    Molzahn, Anita E.
    Clark, Alexander M.
    NURSE EDUCATION TODAY, 2015, 35 (01) : 9 - 11
  • [10] VC rating and quality metrics: Why bother?
    Bricaud, P
    Antipolis, S
    PROCEEDING OF THE 2002 3RD INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, 2002, : 257 - 260