Cyclic oxidation behaviour of N-type (Zr,Ti)Ni(Sn,Sb) and P-type (Zr,Ti)Co (Sn,Sb) thermoelectric materials

被引:3
作者
Gurtaran, Mikdat [1 ]
Zhang, Zhenxue [1 ]
Li, Xiaoying [1 ]
Dong, Hanshan [1 ]
机构
[1] Univ Birmingham, Sch Met & Mat, Birmingham B15 2TT, England
来源
JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T | 2024年 / 30卷
基金
欧盟地平线“2020”;
关键词
Thermoelectric materials; Half-heusler; Cyclic oxidation; Diffusion; TEMPERATURE; PERFORMANCE; SOLUBILITY;
D O I
10.1016/j.jmrt.2024.05.136
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, the fabricated Hf-free N-type (Zr,Ti)Ni(Sn,Sb) and P-type (Zr,Ti)Co(Sn,Sb) thermoelectric materials were subjected to cyclic oxidation testing at 500 degrees C for 10, 30, and 50 cycles. The oxidation behaviour of the materials was systematically investigated by evaluating mass gain to study the oxidation kinetics and by analysing surface morphology, phase constitution and elemental distribution to investigate the oxidation mechanism. The results indicated that both of the materials were severely oxidised during the cyclic oxidation testing, and the mass gain followed the parabolic kinetics and the parabolic rate constant (kp) being 0.006165 mg 2 cm-4 s-1 and 0.000109 mg2cm- 4s- 1 for the N-type and the P-type TE materials, respectively. Alternated multilayers of Ni3Sn4+SnO2+(Zr,Ti)O2 and CoSb + SnO2+Sb2O4+(Zr,Ti)O2 were identified on the surface of the N-type and P-type materials, respectively, after the cyclic testing, which would deteriorate the thermoelectric performance of the materials. The outcome of this study strongly suggests that it is essential to improve the oxidation resistance and the thermal stability of the N-type (Zr,Ti)Ni(Sn,Sb) and P-type (Zr,Ti)Co(Sn,Sb) thermoelectric materials for high-temperature applications.
引用
收藏
页码:7476 / 7484
页数:9
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