Phase measuring deflectometry with monoscopic active display registration

被引:0
作者
Sperling, Yann [1 ]
Bergmann, Ralf B. [1 ,2 ,3 ]
机构
[1] BIAS Bremer Inst Angew Strahltech, D-28359 Bremen, Germany
[2] Univ Bremen, MAPEX Ctr Mat & Proc, D-28359 Bremen, Germany
[3] Fac Phys & Elect Engn, D-28359 Bremen, Germany
来源
OPTICS AND PHOTONICS FOR ADVANCED DIMENSIONAL METROLOGY III | 2024年 / 12997卷
关键词
Phase measuring deflectometry; active display registration; generic camera model; generic camera calibration; vision ray; geometric calibration; VISION RAY CALIBRATION;
D O I
10.1117/12.3015111
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Phase measuring deflectometry is a shape measurement technique for specular surfaces, based on the deflection of light rays coming from active patterns generated by a display. To obtain sufficient data for shape reconstruction, additional information must be provided for regularization. Active display registration is a regularization technique where the display is moved, and two cameras are used to register its position and shape using stereo matching. For measuring high curvature specular surfaces, the large field of view of both cameras must substantially overlap, which limits the setup geometry. In this work, we propose using only one camera for registration. We achieve this with an algorithm that utilizes a geometric model of the display. We show experimental results and compare both display registration methods.
引用
收藏
页数:8
相关论文
共 50 条
[41]   Clear imaging specular surface and fringe patterns by using a concave mirror in phase measuring deflectometry [J].
Li, Ziyu ;
Liu, Xiaohong ;
Chang, Caixia ;
Shi, Yanqing ;
Gao, Nao ;
Meng, Zhaozong ;
Zhang, Zonghua .
OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS VIII, 2021, 11899
[42]   Iterative Reconstruction Method With Auto-Updated Seed Point of Monoscopic Deflectometry for Off-Axis Aspheric [J].
Lan, Menghui ;
Li, Bing ;
Wei, Xiang ;
Zappa, Emanuele .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2025, 74
[43]   Correction of perspective distortion and intensity errors in projected fringe patterns in phase-measuring deflectometry [J].
Lim, Meng Lip ;
Ratnam, Mani Maran ;
Yen, Kin Sam ;
Chua, Shanyu .
OPTICAL ENGINEERING, 2022, 61 (11)
[44]   High-precision measurement of low reflectivity specular object based on phase measuring deflectometry [J].
Yuxiang Wu ;
Huimin Yue ;
Yong Liu .
光电工程, 2017, 44 (08) :772-780+845
[45]   Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry [J].
Huang, Siya ;
Liu, Yuankun ;
Yu, Xin .
SENSORS, 2024, 24 (04)
[46]   A method of sub-aperture slope stitching for testing flat element based on phase measuring deflectometry [J].
Chen, Pengyu ;
Li, Dahai ;
Wang, Qionghua ;
Li, Lei ;
Xu, Kaiyuan ;
Zhao, Jiangang ;
Wang, Ruiyang .
OPTICS AND LASERS IN ENGINEERING, 2018, 110 :392-400
[47]   Off-Axis Point Wave Aberration Testing for Imaging Lens Based on Phase Measuring Deflectometry [J].
Ruan Yilang ;
Li Dahai ;
Yu Linzhi ;
Zhang Xinwei ;
Xiao Xiangtian .
CHINESE JOURNAL OF LASERS-ZHONGGUO JIGUANG, 2022, 49 (21)
[48]   Surface Shape Distortion Online Measurement Method for Compact Laser Cavities Based on Phase Measuring Deflectometry [J].
Zhuang, Yongchen ;
Zheng, Yamin ;
Lin, Shibing ;
Wang, Deen ;
Zhang, Yifan ;
Huang, Lei .
PHOTONICS, 2022, 9 (03)
[49]   A one-dimensional phase-shift technique based on dual-frequency crossed fringe for phase measuring deflectometry [J].
Liu, Yuankun ;
Olesch, Evelyn ;
Yang, Zheng ;
Häusler, Gerd ;
Su, Xianyu .
Zhongguo Jiguang/Chinese Journal of Lasers, 2015, 42 (03)
[50]   A deep learning-based approach to solve the height-slope ambiguity in phase measuring deflectometry [J].
Fan, Xinggang ;
Ma, Tianle ;
Li, Chao ;
Li, Yaonan ;
Liu, Sheng ;
Chen, Heping .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2023, 34 (09)