Phase measuring deflectometry with monoscopic active display registration

被引:0
作者
Sperling, Yann [1 ]
Bergmann, Ralf B. [1 ,2 ,3 ]
机构
[1] BIAS Bremer Inst Angew Strahltech, D-28359 Bremen, Germany
[2] Univ Bremen, MAPEX Ctr Mat & Proc, D-28359 Bremen, Germany
[3] Fac Phys & Elect Engn, D-28359 Bremen, Germany
来源
OPTICS AND PHOTONICS FOR ADVANCED DIMENSIONAL METROLOGY III | 2024年 / 12997卷
关键词
Phase measuring deflectometry; active display registration; generic camera model; generic camera calibration; vision ray; geometric calibration; VISION RAY CALIBRATION;
D O I
10.1117/12.3015111
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Phase measuring deflectometry is a shape measurement technique for specular surfaces, based on the deflection of light rays coming from active patterns generated by a display. To obtain sufficient data for shape reconstruction, additional information must be provided for regularization. Active display registration is a regularization technique where the display is moved, and two cameras are used to register its position and shape using stereo matching. For measuring high curvature specular surfaces, the large field of view of both cameras must substantially overlap, which limits the setup geometry. In this work, we propose using only one camera for registration. We achieve this with an algorithm that utilizes a geometric model of the display. We show experimental results and compare both display registration methods.
引用
收藏
页数:8
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