Static and dynamic analyses and multi-objective optimization of wafer thinning machine's design variables

被引:0
作者
Xie, Guijiu [1 ]
Zhang, Wenbin [1 ]
He, Dongge [1 ]
Yi, Zhongbo [1 ]
Liu, Zhu [1 ]
Wang, Shibo [2 ]
Wang, Yan [2 ]
机构
[1] CETC Beijing Elect Equipment Co Ltd, Beijing 100176, Peoples R China
[2] Tianjin Univ Sci & Technol, Sch Mech Engn, Tianjin 300457, Peoples R China
来源
ENGINEERING RESEARCH EXPRESS | 2024年 / 6卷 / 03期
关键词
wafer thinning machine; static and dynamic characteristics; harmonic response analysis; multi-objective optimization design; SILICON-CARBIDE WAFER; SIC WAFER;
D O I
10.1088/2631-8695/ad74c9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In order to meeting the physical strength, heat dissipation and dimensional requirements of chips, the wafer surface needs to be thinned by wafer thinning machines. In the design of wafer thinning machine, the analysis and optimization of castings is an important and complex issue. In this study, the multi-objective optimization of wafer thinning machine' s design variables are executed due to static and dynamic analyses. According to the analysis results, the design quality, amplitude and equivalent stress of the casting are optimized. The inner diameter of the ring, the height of the ring, the height of the middle groove, and the height of the groove on both sides are selected as the main design variables of the optimization. The results show that the static deformation of the optimized cast structure is 8% lower than the original structure, the overall mass is 4% lower, the operating frequency is 3.5% lower, higher stability, smaller mass and amplitude are obtained after optimization. The research has a great significance for the wafer thinning machines design, and provides theoretical guidance for the development of other lithography equipments.
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页数:12
相关论文
共 19 条
  • [1] Non-contact grinding/thinning of silicon carbide wafer by pure EDM using a rotary cup wheel electrode
    Guan, Junming
    Zhao, Yonghua
    [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2022, 74 : 209 - 223
  • [2] Jenny D., 2023, Sci. Rep, V13, P1
  • [3] Study on Wafer Thinning Characteristics of Ultimate Diamond Disk
    Jin, Xu Xing
    [J]. MANUFACTURING ENGINEERING AND AUTOMATION II, PTS 1-3, 2012, 591-593 : 476 - 479
  • [4] Kumar V Y., 2021, J. Inst. Eng. (India), Series C, V102, P6
  • [5] The Study on the Abrasion Characteristic of Wafer Surface according to Machining Condition
    Lee, Eun-Sang
    Won, Jong-Koo
    Lee, Jung-Taik
    Choi, Hon-Zong
    [J]. ADVANCES IN ABRASIVE TECHNOLOGY XII, 2009, 76-78 : 381 - +
  • [6] An experimental investigation of silicon wafer thinning by sequentially using constant-pressure diamond grinding and fixed-abrasive chemical mechanical polishing
    Li, Gengzhuo
    Xiao, Chen
    Zhang, Shibo
    Sun, Ruoyu
    Wu, Yongbo
    [J]. JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2022, 301
  • [7] Multimode photoacoustic characterization of subsurface damage in ground thin wafers
    Liu, Zaiwei
    Lin, Bin
    Liang, Xiaohu
    Ma, Xiaokang
    Wan, Yangfan
    [J]. INTERNATIONAL JOURNAL OF MECHANICAL SCIENCES, 2023, 238
  • [8] Thinning of a two-inch silicon carbide wafer by plasma chemical vaporization machining using a slit electrode
    Okada, Yu
    Nishikawa, Hiroaki
    Sano, Yasuhisa
    Yamamura, Kazuya
    Yamauchi, Kazuto
    [J]. SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2, 2014, 778-780 : 750 - 753
  • [9] Piluso Nicolo, 2020, Materials Science Forum, V1004, P57, DOI 10.4028/www.scientific.net/MSF.1004.57
  • [10] Multi-objective optimisation for energy-aware flexible job-shop scheduling problem with assembly operations
    Ren, Weibo
    Wen, Jingqian
    Yan, Yan
    Hu, Yaoguang
    Guan, Yu
    Li, Jinliang
    [J]. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 2021, 59 (23) : 7216 - 7231