Atomic-scale imaging of laser-driven electron dynamics in solids

Resolving laser-driven electron dynamics on their natural time and length scales is essential for understanding and controlling light-induced phenomena. Capabilities to reveal these dynamics are limited by challenges in interpreting wave mixing of a driving and a probe pulse, low energy resolution at ultrashort time scales and a lack of atomic-scale resolution by standard spectroscopic techniques. Here, we demonstrate how ultrafast x-ray diffraction can access fundamental information on laser-driven electronic motion in solids. We propose a method based on subcycle-resolved x-ray-optical wave mixing that allows for a straightforward reconstruction of key properties of strong-field-induced electron dynamics with atomic spatial resolution. Namely, this technique provides both phases and amplitudes of the spatial Fourier transform of optically-induced charge distributions, their temporal behavior, and the direction of the instantaneous microscopic optically-induced electron current flow. It captures the rich microscopic structures and symmetry features of laser-driven electronic charge and current density distributions. Manipulation of materials properties by laser driving can lead to future technological applications, but a complete picture of its mechanisms is missing. In their paper, authors propose a method based on ultrafast x-ray diffraction that allows for resolving laser-driven electron dynamics on their natural time and length scales.