Effect of Thermal Annealing on Properties Ga2O3/GaAs:Cr Heterostructures

被引:0
作者
Kalygina, V. M. [1 ]
Kiseleva, O. S. [1 ]
Kopyev, V. V. [1 ]
Kushnarev, B. O. [1 ]
Oleinik, V. L. [1 ]
Petrova, Y. S. [1 ]
Tsymbalov, A. V. [1 ]
机构
[1] Tomsk State Univ, Tomsk 634050, Russia
关键词
dark current; photocurrent; UV radiation; Ga2O3/GaAs:Cr structures; autonomous operation mode; GAAS; PERFORMANCE;
D O I
10.1134/S106378422406015X
中图分类号
O59 [应用物理学];
学科分类号
摘要
Data on the sensitivity of Ga2O3/GaAs:Cr heterostructures are presented to long-wave and UV (lambda = 254 nm) radiation. The samples were obtained by RF magnetron sputtering of a gallium oxide film on non-heated GaAs:Cr substrates. Gallium arsenide plates with a Ga2O3 film were divided into two parts: one half was not annealed, and the other was annealed in argon at 500 degrees C for 30 min. Regardless of the presence or absence of heat treatment, the studied structures exhibit a photovoltaic effect and are able to operate in an autonomous mode. It is shown that a noticeable sensitivity to long-wave radiation appears in the samples only after thermal annealing of gallium oxide films. The response and recovery times of such UV radiation detectors do not exceed 1 second.
引用
收藏
页码:1584 / 1589
页数:6
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