共 2 条
Low-contrast X-ray image defect segmentation via a novel core-profile decomposition network
被引:0
|作者:
Liu, Xiaoyuan
[1
]
Liu, Jinhai
[1
]
Zhang, Huanqun
[2
]
Zhang, Huaguang
[1
]
机构:
[1] Northeastern Univ, Coll Informat Sci & Engn, Shenyang 110819, Peoples R China
[2] Shenyang Paidelin Technol Co Ltd, Shenyang 110081, Peoples R China
关键词:
Defect segmentation;
Low-contrast X-ray image;
Core feature;
Profile refinement;
Quality control;
D O I:
10.1016/j.compind.2024.104123
中图分类号:
TP39 [计算机的应用];
学科分类号:
081203 ;
0835 ;
摘要:
Accurate X-ray image defect segmentation is of paramount importance in industrial contexts, as it is the foundation for product quality control and production safety. Deep learning (DL) has demonstrated powerful image scene understanding capabilities and has achieved unprecedented performance in defect segmentation tasks. However, existing DL methods suffer from significant performance degradation when facing low-contrast X-ray images, as the core information of defects is often obscured and the profile details are ambiguous. To address this issue, this paper explicitly decomposes the X-ray defect segmentation task into two subtasks: core feature learning and elasticity profile refinement, allowing task "serial"decomposition and performance "parallel"improvement. On this basis, a novel core-profile decomposition network (CPDNet) is developed to achieve accurate defect segmentation of X-ray images. Specifically, the core feature learning module is designed to construct the effective feature space from two views, discriminative and structural, to extract defect-related core features from X-ray images. Subsequently, the elasticity profile refinement module is developed to further improve the defect segmentation performance, which makes the first attempt to define the profile refinement as an out-of-distribution detection and leverage the elasticity score to refine the profile details at the pixel level. To fully evaluate the presented method, we conduct a series of experiments using two real-world X-ray defect datasets, and the results demonstrate that the CPDNet outperforms state-of-the-art methods.
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