Enhanced Shubnikov-de Haas Oscillations in High Mobility InAlN/GaN Two-Dimensional Electron Gas

被引:0
作者
Karmakar, Chiranjit [1 ,2 ]
Kaneriya, Rakesh [1 ]
Mukherjee, Sudip [3 ]
Sinha, Santanu [1 ]
Kumar, Punam Pradeep [1 ]
Babu, Peram Delli [3 ]
Joshi, Utpal S. [2 ]
机构
[1] ISRO, Space Applicat Ctr, Micro Elect Dev Grp, Ahmadabad 380015, India
[2] Gujarat Univ, Univ Sch Sci, Dept Phys, Ahmadabad 380009, India
[3] UGC DAE Consortium Sci Res, Mumbai Ctr, Trombay 400085, Mumbai, India
关键词
GaN HEMT; Quantum Transport; SdHoscillations; InAlN barrier; 2DEG; STEM; HETEROSTRUCTURES; QUANTUM; LOCALIZATION; SCATTERING; TRANSPORT; LEVEL;
D O I
10.1021/acsaelm.4c01089
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A high-quality In0.17Al0.83N/GaN heterostructure with a record high mobility of 11370 cm(2) V-1 s(-1) is achieved at 2 K using the metal oxide chemical vapor deposition (MOCVD) technique, where enhanced Shubnikov-de Haas (SdH) oscillations of two-dimensional electron gas (2DEG) are observed at low temperatures up to 20 K. In this study, we explore the quantum transport properties induced by 2DEG using perpendicular magnetic (B-perpendicular to) field strengths up to 14 T. Excellent crystalline and structural quality of the ultrathin InAlN/GaN heterostructure was revealed by high resolution X-ray diffraction (HRXRD) and high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM). From the temperature-dependent oscillation amplitude, we have derived effective mass m* approximate to 0.247m(e). Furthermore, the dominance of small-angle scattering in the 2DEG channel is evidenced by a quantum lifetime (tau(q)) to Hall transport lifetime (tau(t)) ratio of less than unity (tau(q)/tau(t) << 1). These findings offer a robust foundation for exploration into fundamental physics and emergent phenomena in quantum transport within the InAlN/GaN 2DEG, leading to better suitability and a way forward to high power-high frequency GaN high electron mobility transistor (HEMT) development.
引用
收藏
页码:6238 / 6245
页数:8
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