Proposal of a Multiscale High Accuracy Engineering Approach for Single-Event Effects Analysis in Modern Technologies

被引:0
作者
Coic, L. [1 ]
Andrianjohany, N. [1 ]
Sukhaseum, N. [1 ,2 ]
Guillermin, J. [1 ]
Varotsou, A. [1 ]
Santin, G. [3 ]
机构
[1] TRAD Tests & Radiat, F-31670 Labege, France
[2] Thales Alenia Space, F-31100 Toulouse, France
[3] European Space Agcy ESTEC, NL-2201 AG Noordwijk, Netherlands
关键词
Sensitivity; Estimation; Standards; Monte Carlo methods; Shape; Analytical models; Adaptation models; Heavy ions; Monte Carlo (MC) simulation; rate estimation method; single-event effects (SEEs); UPSET RATE PREDICTION;
D O I
10.1109/TNS.2024.3412207
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Standard heavy-ion single-event rate estimation methods are well adapted to mature technologies used in the space industry. However, the adoption of 3-D structures as well as advanced technology nodes may reduce the confidence in established rate estimation methods such as integral rectangular parallelepiped (IRPP). In this work, a single-event effect (SEE) rate calculation method with a GEANT4-based Monte Carlo (MC) approach was designed in order to address this shortcoming. It is intended as an extension to the IRPP method in the context of advanced technologies in the space industry. This article presents the general concepts and theory behind this approach, as well as results from validation cases based on flight data.
引用
收藏
页码:1699 / 1706
页数:8
相关论文
共 39 条
  • [1] Single Event Effect prediction early in the design phase and latchup case study on ASIC
    Andrianjohany, N.
    Augustin, G.
    Coulie, K.
    Gouyet, L.
    Rahajandraibe, W.
    Chatry, N.
    Standarovski, D.
    Ecoffet, R.
    [J]. 2018 18TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS), 2018, : 60 - 67
  • [2] [Anonymous], 2012, Standard ECSS-QST-60-15C
  • [3] [Anonymous], 2008, Standard ECSS-E-ST-10-12C
  • [4] [Anonymous], 2014, Standard ESCC Basic Specification 25100, Vsecond
  • [5] [Anonymous], 2010, Standard ECSS-E-HB-10-12A
  • [6] Bezerra F., 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems. 10th RADECS Conference (RADECS 2009), P126, DOI 10.1109/RADECS.2009.5994566
  • [7] 14 Years of In-Flight Experimental Data on CARMEN-MEX
    Bezerra, Francoise
    Ruffenach, Marine
    Ecoffet, Robert
    Carron, Jerome
    Mekki, Julien
    Coic, Leo
    Guillermin, Jeremy
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2023, 70 (08) : 1533 - 1540
  • [8] DAlessio M., 2013, P 14 EUR C RAD EFF C, P1
  • [9] Current and Future Challenges in Radiation Effects on CMOS Electronics
    Dodd, P. E.
    Shaneyfelt, M. R.
    Schwank, J. R.
    Felix, J. A.
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2010, 57 (04) : 1747 - 1763
  • [10] Duzellier S., 2010, MUSCA SEP3 To Investigate the Single Event Effects for Space Missions