Electron-Beam-Induced Modification of N-Heterocyclic Carbenes: Carbon Nanomembrane Formation

被引:0
|
作者
Cegielka, Daria M. [1 ,2 ]
Frey, Martha [3 ]
Koziel, Krzysztof [4 ]
Neumann, Christof [3 ]
Turchanin, Andrey [3 ,5 ]
Cyganik, Piotr [1 ]
机构
[1] Jagiellonian Univ, Smoluchowski Inst Phys, Fac Phys Astron & Appl Comp Sci, PL-30348 Krakow, Poland
[2] Jagiellonian Univ, Doctoral Sch Exact & Nat Sci, PL-30348 Krakow, Poland
[3] Friedrich Schiller Univ Jena, Inst Phys Chem, D-07743 Jena, Germany
[4] Jagiellonian Univ, Fac Chem, Krakow, Poland
[5] Jena Ctr Soft Matter, D-07743 Jena, Germany
来源
JOURNAL OF PHYSICAL CHEMISTRY LETTERS | 2024年 / 15卷 / 32期
关键词
SELF-ASSEMBLED MONOLAYERS; INDUCED CROSS-LINKING; MOLECULAR ELECTRONICS; CHEMICAL LITHOGRAPHY; IRRADIATION; GOLD; FABRICATION; SURFACES; FUNCTIONALIZATION; STABILITY;
D O I
10.1021/acs.jpclett.4c01705
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electron irradiation of self-assembled monolayers (SAMs) is a versatile tool for lithographic methods and the formation of new 2D materials such as carbon nanomembranes (CNMs). While the interaction between the electron beam and standard thiolate SAMs has been well studied, the effect of electron irradiation for chemically and thermally ultrastable N-heterocyclic carbenes (NHCs) remains unknown. Here we analyze electron irradiation of NHC SAMs featuring different numbers of benzene moieties and different sizes of the nitrogen side groups to modify their structure. Our results provide design rules to optimize NHC SAMs for effective electron-beam modification that includes the formation of sulfur-free CNMs, which are more suitable for ultrafiltration applications. Considering that NHC monolayers exhibit up to 100 times higher stability of their bonding with the metal substrate toward electron-irradiation compared to standard SAMs, they offer a new alternative for chemical lithography where structural modification of SAMs should be limited to the functional group.
引用
收藏
页码:8196 / 8204
页数:9
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