Radon Representation-Based Feature Descriptor for Texture Classification

被引:31
作者
Liu, Guangcan [1 ]
Lin, Zhouchen [2 ]
Yu, Yong [1 ]
机构
[1] Shanghai Jiao Tong Univ, Dept Comp Sci & Engn, Shanghai 200240, Peoples R China
[2] Microsoft Res Asia, Visual Comp Grp, Beijing 100190, Peoples R China
关键词
Image classification; image texture analysis; INVARIANT; SEGMENTATION; RECOGNITION; TRANSFORM; ROTATION;
D O I
10.1109/TIP.2009.2013072
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
In this paper, we aim to handle the intraclass variation resulting from the geometric transformation and the illumination change for more robust texture classification. To this end, we propose a novel feature descriptor called Radon representation-based feature descriptor (RRFD). RRFD converts the original pixel represented images into Radon-pixel images by using the Radon transform. The new Radon-pixel representation is more informative in geometry and has a much lower dimension. Subsequently, RRFD efficiently achieves affine invariance by projecting an image (or an image patch) from the space of Radon-pixel pairs onto an invariant feature space by using a ratiogram, i.e., the histogram of ratios between the areas of triangle pairs. The illumination invariance is also achieved by defining an illumination invariant distance metric on the invariant feature space. Comparing to the existing Radon transform-based texture features, which only achieve rotation and/or scaling invariance, RRFD achieves affine invariance. The experimental results on CUReT show that RRFD is a powerful feature descriptor that is suitable for texture classification.
引用
收藏
页码:921 / 928
页数:8
相关论文
共 44 条
[1]  
Agarwal S, 2002, LECT NOTES COMPUT SC, V2353, P113
[2]   Invariant image analysis based on radon transform and SVD [J].
AlShaykh, OK ;
Doherty, JF .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 1996, 43 (02) :123-133
[3]   RECOGNITION OF ARABIC CHARACTERS [J].
ALYOUSEFI, H ;
UDPA, SS .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1992, 14 (08) :853-857
[4]  
[Anonymous], 2000, BMVC
[5]  
Balakrishnama G., 1998, Linear Discriminant Analysis - A brief Tutorial
[6]   Affine invariant texture segmentation and shape from texture by variational methods [J].
Ballester, C ;
Gonzalez, M .
JOURNAL OF MATHEMATICAL IMAGING AND VISION, 1998, 9 (02) :141-171
[7]   A tutorial on Support Vector Machines for pattern recognition [J].
Burges, CJC .
DATA MINING AND KNOWLEDGE DISCOVERY, 1998, 2 (02) :121-167
[8]   Class-specific material categorisation [J].
Caputo, B ;
Hayman, E ;
Mallikarjuna, P .
TENTH IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION, VOLS 1 AND 2, PROCEEDINGS, 2005, :1597-1604
[9]   Wavelet-based rotational invariant roughness features for texture classification and segmentation [J].
Charalampidis, D ;
Kasparis, T .
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2002, 11 (08) :825-837
[10]  
CHETVERIKOV D, 2000, P INT C PATT REC, P3901