Modulated step-heating thermography for coating thickness measurement

被引:0
|
作者
Chen, Fei [1 ,2 ]
Zhang, Kai [3 ]
Jiang, Haijun [3 ]
Shen, Zhonghua [1 ,2 ]
Chen, Li [4 ]
机构
[1] Nanjing Univ Sci & Technol, Sch Sci, Nanjing 210094, Peoples R China
[2] Nanjing Univ Sci & Technol, MIIT Key Lab Semicond Microstruct & Quantum Sensin, Nanjing 210094, Peoples R China
[3] Novelteq Ltd, Nanjing 210046, Peoples R China
[4] Univ Elect Sci & Technol China, Sch Optoelect Sci & Engn, Chengdu 611731, Peoples R China
基金
美国国家科学基金会;
关键词
Coating thickness measurement; Step-heating; Modulated step-heating thermography; Lock-in thermography; THERMAL-WAVE INTERFEROMETRY; LOCK-IN THERMOGRAPHY; COMMON TOOLS; PULSE; SENSITIVITY; RADIOMETRY;
D O I
10.1016/j.ndteint.2024.103140
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper, the modulated step-heating thermography is proposed for opaque coating thickness measurement. The surface is heated by a modulated heating flux at a frequency that the thermal wave is confined within the coating layer. The DC component of the thermal signal is normalized by the amplitude of the AC component to cancel out the influences from the variations in heating intensity, surface absorptivity and emissivity, resulting in a linear correlation to the coating thickness. Meanwhile, it eliminates the need for tedious frequency trail and the issue of the nonmonotonicity as suffered in conventional thermography. Both theoretical and experimental results confirmed the effectiveness. Specimens with thickness ranging from 100 to 400 mu m are measured with a relative error within +/- 7.9 %.
引用
收藏
页数:8
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