Chromaticity-integrated principal component analysis for spectral phase measurement in spectrally resolved white light interferometry

被引:0
作者
Bhanot, Pardeep [1 ,2 ]
Debnath, Sanjit k. [1 ,2 ]
机构
[1] Acad Sci & Innovat Res AcSIR, Ghaziabad 201002, Uttar Pradesh, India
[2] CSIR Cent Sci Instruments Org CSIR CSIO, Chandigarh 160030, India
关键词
SHIFTING INTERFEROMETRY; LEAST-SQUARES; ALGORITHM; EXTRACTION; THICKNESS;
D O I
10.1364/AO.529296
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper, we propose chromaticity-integrated principal component analysis for spectral phase measurement using three phase shifted spectral interferograms with non-uniform phase shifts. A spectral interferogram exhibits an inherent variable phase shift along the chromaticity axis that introduces errors in spectral phase measurement on wavelengths other than the mean wavelength. To address this issue, we employ the principal component analysis by integrating the spectral information from neighboring pixels along the chromaticity axis for each pixel in the scan axis of the interferogram. To validate the efficacy of the proposed algorithm, we compared its results with the traditional five-step algorithm.
引用
收藏
页码:7103 / 7108
页数:6
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