Low-loss and low-cross talk polarization-insensitive multimode silicon waveguide crossing

被引:2
作者
Chen, Yun [1 ]
Wang, Pengjun [2 ]
Fu, Qiang [3 ]
Sun, Yuhan [4 ]
Zou, Yi [4 ]
Dai, Shixun [1 ,5 ]
Chen, Weiwei [1 ]
Chen, Haoqi [1 ]
Li, Jun [1 ]
Dai, Tingge [6 ]
Yang, Jianyi [6 ]
机构
[1] Ningbo Univ, Fac Elect Engn & Comp Sci, Ningbo 315211, Peoples R China
[2] Wenzhou Univ, Coll Elect & Elect Engn, Wenzhou 325035, Peoples R China
[3] Ningbo Univ, Coll Sci & Technol, Ningbo 315300, Peoples R China
[4] ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai 201210, Peoples R China
[5] Ningbo Univ, Res Inst Adv Technol, Lab Infrared Mat & Devices, Ningbo 315211, Peoples R China
[6] Zhejiang Univ, Dept Informat Sci & Elect Engn, Hangzhou 310027, Peoples R China
基金
中国国家自然科学基金;
关键词
MODE; COMPACT;
D O I
10.1364/OL.537506
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A polarization-insensitive multimode silicon waveguide crossing is investigated and experimentally characterized in this Letter. By employing the particle swarm optimization (PSO) algorithm and finite difference time domain (FDTD) method, the lengths and widths of the waveguides in the proposed device are optimized for attaining wide bandwidth, small insertion loss (IL), low cross talk (CT), and compact size. Measurement results reveal that the footprint of the presented device is 11.92 mu m x 11.92 mu m. From 1520 to 1600 nm, the measured insertion loss and cross talk are smaller than 0.67 dB and -28.6 dB in the case of the TE0 mode, lower than 0.65 dB and -28.7 dB in the case of the TE1 mode, less than 0.48 dB and -36.3 dB in the case of the TM0 mode, and lower than 0.62 dB and -28 dB in the case of the TM1 similar technologies, are reserved.
引用
收藏
页码:4930 / 4933
页数:4
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