Noise suppression in pulsed IR thermographic NDT: Efficiency of data processing algorithms

被引:0
作者
Vavilov, V. P. [1 ]
Chulkov, A. O. [1 ]
Shiryaev, V. V. [1 ]
Kuimova, M. V. [1 ]
Zhang, Hai [2 ]
机构
[1] Natl Res Tomsk Polytech Univ, Lenin Ave 30, Tomsk 634050, Russia
[2] Harbin Inst Technol, Ctr Composite Mat & Struct CCMS, Harbin 150001, Peoples R China
关键词
Infrared thermography; Nondestructive testing; Noise; Data processing; Modeling; DEFECT DETECTION;
D O I
10.1016/j.ndteint.2024.103240
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Various types of noise, which accompany active TNDT procedures using optical heating, have been analyzed, both numerically and experimentally. An emphasis has been made on the suppression of surface clutter, which represents local areas of varying absorptivity/emissivity. The concept of signal-to-noise that is typically used in defect detection has been applied to fixed pattern noise in order to compare capabilities of data processing algorithms in reducing surface clutter. The experimental investigation has been fulfilled on a special sample containing both subsurface air-filled defects and areas with varying emissivity/absorptivity. The best suppression of the fixed pattern noise was provided by the complex wavelet transform and principle component analysis. Because of 3D heat diffusion, clutter spot boundaries are often underlined by particular data processing algorithms thus producing specific contours. The test situations where subsurface defects are located under localized clutter spots have been analyzed to demonstrate an overshadowing effect of such spots when detecting hidden defects.
引用
收藏
页数:11
相关论文
共 28 条
  • [1] Accardi E, 2019, P 14 INT C QUANT INF, P25, DOI [10.1016/j.prostr.2017.12.036.NDT.netIssue,.Accessed, DOI 10.1016/J.PROSTR.2017.12.036.NDT.NETISSUE,.ACCESSED]
  • [2] Hilbert transform-based pulse compression approach to infrared thermal wave imaging for sub-surface defect detection in steel material
    Arora, V.
    Siddiqui, J. A.
    Mulaveesala, R.
    Muniyappa, A.
    [J]. INSIGHT, 2014, 56 (10) : 550 - 552
  • [3] Bison C., NATO ASI series, series E: applied sciences, V262, P193
  • [4] Breitenstein O, 2010, Springer Series in Advanced Microelectronics, V10, P250
  • [5] Defect Detection Capabilities of Pulse Compression Based Infrared Non-Destructive Testing and Evaluation
    Dua, Geetika
    Arora, Vanita
    Mulaveesala, Ravibabu
    [J]. IEEE SENSORS JOURNAL, 2021, 21 (06) : 7940 - 7947
  • [6] Galmiche F, Wavelet transform applied to pulsed phase thermography
  • [7] Garca R H-G., 2013, Optics And Photonics J, V3, P20
  • [8] Barker coded thermal wave imaging for defect detection in carbon fibre-reinforced plastics
    Ghali, V. S.
    Panda, S. S. B.
    Mulaveesala, R.
    [J]. INSIGHT, 2011, 53 (11) : 621 - 624
  • [9] Grinzato E, 1999, P 5 WORKSH ADV INFR, P117
  • [10] Gruber K.-H., 1965, Emissivity-independent infrared thermal testing method. Mater Eval