Tolerance of Corundum-Structured Tin-Doped Indium Oxide Thin Films to Gamma-ray Irradiation

被引:0
作者
Shimazoe, Kazuki [1 ]
Kurosawa, Shunsuke [2 ,3 ,4 ]
Tanaka, Hiroki [5 ]
Takata, Takushi [5 ]
Nishinaka, Hiroyuki [1 ]
机构
[1] Kyoto Inst Technol, Fac Elect Engn & Elect, Sakyo Ku, Kyoto, Kyoto 6068585, Japan
[2] Tohoku Univ, New Ind Creat Hatchery Ctr, Aoba Ku, Sendai, Miyagi 9808579, Japan
[3] Tohoku Univ, Inst Mat Res, Aoba Ku, Sendai, Miyagi 9808577, Japan
[4] Osaka Univ, Inst Laser Engn, Suita, Osaka 5650871, Japan
[5] Kyoto Univ, Inst Integrated Radiat & Nucl Sci, Kumatori Cho, Osaka 5900494, Japan
来源
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2024年
基金
日本科学技术振兴机构;
关键词
corundum; gamma-ray; In2O3; Indium tin oxide; mist chemical vapor deposition; GROWTH;
D O I
10.1002/pssb.202400368
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Corundum-structured Sn-doped indium oxide (rh-ITO) is investigated as a novel transparent conductive oxide. Herein, its gamma-ray tolerance up to a total dose of 77 kGy is examined for potential applications in harsh environments, such as space. The investigations are conducted on rh-ITO with Sn concentrations of 0 and 5 at%. X-ray diffraction 2 theta-omega scan analysis reveals that no phase separation occurs due to gamma-ray irradiation. The carrier concentration in undoped rh-In2O3 increases after irradiation, indicating that the gamma rays displace the oxygen atoms and form oxygen defects that generate donors. The high visible light transparency of rh-In2O3 and rh-ITO is maintained after irradiation. This study demonstrates the high stability of rh-ITO to gamma-ray irradiation until 77 kGy dose. This work contributes to the application of rh-ITO as an electrode in high-radiation environments.
引用
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页数:5
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