Thermal Runaway Indicators of Metallized Polypropylene Film Capacitors

被引：0

作者：

Rochefort, Claire ^{[1
,2
]}

Venet, Pascal ^{[1
]}

Clerc, Guy ^{[1
]}

Sari, Ali ^{[1
]}

Wang, Miao-Xin ^{[2
]}

Mitova, Radoslava ^{[2
]}

机构：

[1] Univ Claude Bernard Lyon 1, Univ Lyon, Ecole Cent Lyon, INSA Lyon,CNRS,Ampere,UMR5005, F-69622 Villeurbanne, France

[2] Schneider Elect, Power Convers Ind Business, F-38000 Grenoble, France

来源：

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 2024年 / 31卷 / 04期

关键词：

Capacitors; Dielectrics; Electric breakdown; Electrodes; Temperature measurement; Discharges (electric); Capacitance; Accelerated aging; failures detection; metallized film capacitors; thermal breakdown;

D O I：

10.1109/TDEI.2024.3385351

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Metallized film capacitors are a common cause of electronic system failure. Since some of their failures can lead to serious accidents and severe damage to their surroundings, such as explosions or fires, their fail-safe should be ensured independently of their intern structure. The aim of this article is to investigate the runaway process leading to these catastrophic failures. Non-destructive accelerated aging tests to prevent unusual failures are carried out on 42 capacitors. Their key characteristics are measured periodically. Runaway indicators are found and analyzed. Based on the results, knowledge about the runaway process is deepened. Furthermore, a solution appears to avoid the catastrophic failures.

引用

页码：2136 / 2143

页数：8

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