Method of Single Event Effects Radiation Hardened Design for DC-DC Converter Based Load Transient Detection

被引:0
作者
Guo, Zhongjie [1 ]
Liu, Nan [1 ]
Lu, Hu [1 ]
Li, Mengli [1 ]
Qiu, Ziyi [1 ]
机构
[1] Xian Univ Technol, Sch Automat & Informat Engn, Xian 710048, Peoples R China
基金
中国国家自然科学基金;
关键词
Voltage fluctuations; Fluctuations; Radiation hardening (electronics); Energy exchange; DC-DC power converters; Dynamic range; Transient analysis; DC-DC converter; Analog single-event transient effect; Load transient detection; Radiation hardened by design; TMR;
D O I
10.23919/cje.2022.00.442
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Aiming at the impact of load current change on single-event transient, the essential difference between single-event transient and load transient of DC-DC converter is deeply studied. A hardened circuit based on load transient detection is proposed. The circuit detects the load transient information in time and outputs a control signal to control the single event hardened circuit, thereby realizing the improvement of the transient characteristics of the system under dynamic conditions. Based on the 180 nm bipolar-CMOS-DMOS (BCD) process, the design and physical verification of a boost converter are completed. The experimental results show that the input voltage range is 2.9-4.5 V, the output voltage range is 5.8-7.9 V, and the load current is 0-55 mA. During load transients, the load detection circuit turns off the hardened circuit in time, avoiding system oscillation and widening the dynamic range of the hardening circuit. Under the single-event transient, the output voltage fluctuation of the system does not exceed the maximum ripple voltage, and the single-event transient suppression ability reaches more than 86%, the system can work well with linear energy transfer of about 100MeV cm(2)/mg.
引用
收藏
页码:1154 / 1164
页数:11
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